EXPERIMENTAL & COMPUTATIONAL CAPABILITIES

Beyond the group’s 2,500 sq. ft. of lab space within Northwestern’s Technological Institute, we leverage facilities at Argonne National Lab (ANL), Northwestern’s Micro/Nano Fabrication Center (NUFAB), and advanced computing centers.

MATERIAL CHARACTERIZATION

FEI NOVA NANOSEM 600

Field Emission Scanning Electron Microscope

Veeco Atomic Force Microscope (AFM)

Nanometer scanning resolution, in-house software for the generation of arbitrary patterns. In-house built humidity control station, operable in the 5%-65% relative humidity range

Park XE-120 AFM & Horiba Labram Raman Microscope

Confocal Raman microscope system is optimized for visible to NIR range and integrated with the XE-120 AFM. The AFM system has nm scanning resolution, and environmental AFM and Kelvin probe microscopy capabilities

MULTISCALE MECHANICAL TESTING

Alemnis Micromechanical System

Intended for in situ indentation/compression tests in SEM, Raman, and synchrotron beamlines

MTS NanoXP Nanoindenter

High resolution X-Y Stage, continuous stiffness measurement, interfaced with TestWorks 4 Professional Level Software

Fullam Microtensile testing machine

Max. Load of 5000N, resolution of 5N and 1µm displacement resolution

Micromanipulator Probe Station 6000

For MEMS/NEMS electrical characterization and actuation. Comes with 4” vacuum chuck, Mititoya Optical Head with 5x, 10x, 20x and 50x objectives, Hitachi 3 chip color CCD camera, and TMS vibration isolation table

BIOLOGICAL TESTING

NFP-E

Nanofountain Probe, the first fully automated single cell transfection technology for adherent cells.

COMPUTING

Abaqus CAE

Implicit and explicit finite element simulation software for static and dynamic analysis

Comsol Multiphysics

Multiphysics simulations

LAMMPS

Classical molecular dynamics code with a focus on materials modeling

Supercomputing Resources

Access to Quest supercomputer at Northwestern and XSEDE-Texas Advanced Computing Center

OTHER RESOURCES

One Ventus 532 CW Solid State Diode Pump Laser.
One Melles Griot Tunable-Wavelength Argon-Ion Laser.
A custom built, double-tilt JEOL TEM holder is available for in situ TEM characterization and testing.
One Klocke Nanomanipulator for in site SEM manipulation.
One Keithley 4200 SCS semiconductor characterization system with 2 medium power source measurement units (SMU) and two remote pre-amplifiers. Intuitive, point-and-click Windows based environment. The current measurement resolution is up to 0.1 fA.
One Agilent 6613C GPIB DC Power Supply, 100 Vdc, 0.5 A, RS232 operation. Rated at 50 W, 47- 63 Hz line input.
Two Agilent E3611A dc power supply, 20 V/1.5 A and 35 V/0.85 A. Rated at 30 watts, 47-63 Hz line input.
One Agilent 34401A Digital multimeter, 6.5 digits Max, input voltage: 1000 Vdc or 750 Vac. RS-232 and GP-IB standard; 1000 readings per sec, 512K reading storage. Accepts SCPI, 3478, & Fluke 8840 commands.
One Agilent 33250A 80 MHz Function/Waveform Generator w/std. Functions. AM, FM, FSK and burst are standard, with linear and log sweep with GPIB & RS232 interfaces.
One LeCroy 9384L Oscilloscope.
One Keysight E3620A Dual Output DC Power Supply, 25 V/1 A. Rated at 30 W, 47-63 Hz line input.
SRS – Mainframe – Model: SIM900 – SN: 105763 – NRTL ESA #E062611
Two Agilent E3612A DC Power Supply, 60 V/0.5 A and 120 V/0.25 A. Rated at 30 W, 47-63 Hz line input.
NATIONAL INSTRUMENTS – USB-6361 Device – (Low Voltage)
One Agilent 6614C System DC Power Supply